Tech Exchange with Delong Instruments

In our Tech Exchange on 20th February 2026, Jaromír Bačovský from Delong Instruments will talk about "Low-Voltage, High Versatility: Multimodal Low-Voltage Electron Microscopy for Materials and Life Sciences".

Low-voltage transmission electron microscopes (LVEMs) designed and developed by Delong Instruments operate at accelerating voltages typically below 25 kV and are well known for their excellent imaging properties for samples composed of light elements. Compared to conventional TEMs, LVEMs provide exceptionally high image contrast due to the strong interaction between the low-voltage electron beam and the specimen.

The reduced electron energy leads to increased electron scattering, enhancing image contrast and revealing fine structural details even in materials challenging for conventional TEM, including biological samples, histological sections, proteins, polymers, graphene, and other low-contrast materials. The unique combination of TEM, STEM, and SEM imaging modes establishes LVEM as a multimodal electron microscopy platform, enabling comprehensive investigation of a broad variety of samples. In addition to imaging, LVEMs offer analytical capabilities such as energy-dispersive X-ray spectroscopy (EDS), electron diffraction, and dark-field imaging, thus providing a versatile tool for both life science and materials science applications.